Extending the intensity model with joint defaults to incorporate the lasting effects from common credit events
| Year of publication: |
2018
|
|---|---|
| Authors: | Miao, Daniel Wei‐Chung ; Lin, Xenos Chang‐Shuo ; Yu, Steve Hsin‐Ting ; Lee, Yung‐Hsin |
| Published in: |
Applied Stochastic Models in Business and Industry. - Wiley, ISSN 1526-4025, ZDB-ID 2002340-6. - Vol. 35.2018, 3 (12.07.), p. 681-703
|
| Publisher: |
Wiley |
| Type of publication: | Article |
|---|---|
| Language: | English |
| Other identifiers: | 10.1002/asmb.2371 [DOI] |
| Source: | Other ZBW resources |
Persistent link: https://www.econbiz.de/10012272393