Failure-censored Accelerated Life Test Sampling Plans for Weibull Distribution Under Expected Test Time Constraint
| Year of publication: |
1995
|
|---|---|
| Authors: | Bai, D.S. ; Chun, Y.R. ; Kim, J.G. |
| Published in: |
Reliability engineering & system safety. - London : Elsevier, ISSN 0951-8320, ZDB-ID 612029. - Vol. 50.1995, 1, p. 61-68
|