Failure-mechanism models for material aging due to interdiffusion
| Year of publication: |
1994
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|---|---|
| Authors: | Li, J. ; Dasgupta, A. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 43.1994, 1, p. 2-10
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