Forecasting flow time in semiconductor manufacturing using knowledge discovery in databases
Year of publication: |
2013
|
---|---|
Authors: | Tirkel, Israel |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 51.2013, 18 (1.9.), p. 5536-5548
|
Saved in:
Saved in favorites
Similar items by person
-
Modeling cost benefit analysis of inspection in a production line
Tirkel, Israel, (2014)
-
The relationship between yield and flow time in a production system under inspection
Tirkel, Israel, (2012)
-
Forecasting flow time in semiconductor manufacturing using knowledge discovery in databases
Tirkel, Israel, (2013)
- More ...