Formation of porous silicon: an in situ investigation with high-resolution X-ray diffraction
| Year of publication: |
2001
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|---|---|
| Authors: | Chamard, V. ; Pichat, C. ; Dolino, G. |
| Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 21.2001, 2, p. 185-190
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| Publisher: |
Springer |
| Subject: | PACS. 61.10.Eq X-ray scattering (including small-angle scattering) | 68.55.-a Thin film structure and morphology | 81.07.-b Nanoscale materials and structures: fabrication and characterization | 68.55.Ac Nucleation and growth: microscopic aspects |
| Extent: | text/html |
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| Type of publication: | Article |
| Source: |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10010556967