Frequentist properties of Bayesian inequality tests
David M. Kaplan, Longhao Zhuo
| Year of publication: |
2021
|
|---|---|
| Authors: | Kaplan, David M. ; Zhuo, Longhao |
| Published in: |
Journal of econometrics. - Amsterdam [u.a.] : Elsevier, ISSN 0304-4076, ZDB-ID 184861-6. - Vol. 221.2021, 1, p. 312-336
|
| Subject: | Generalized Bayes rule | Limit experiment | Minimax | Nonstandard inference | Posterior | Bayes-Statistik | Bayesian inference | Schätztheorie | Estimation theory | Experiment | Wahrscheinlichkeitsrechnung | Probability theory | Statistische Methodenlehre | Statistical theory |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.jeconom.2020.05.015 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012618838