Goodness-of-Fit Diagnostics for Bayesian Hierarchical Models
| Year of publication: |
2012
|
|---|---|
| Authors: | Yuan, Ying ; Johnson, Valen E. |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 68.2012, 1, p. 156-164
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010683957