Hardware Error Likelihood Induced by the Operation of Software
Year of publication: |
2011
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Authors: | Huang, B ; Rodriguez, M ; Li, M ; Bernstein, J B ; Smidts, C S |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 60.2011, 3, p. 622-640
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