HOW DOES COUNTRY RISK AFFECT INNOVATION? AN APPLICATION TO FOREIGN PATENTS REGISTERED IN THE USA
| Year of publication: |
2006
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|---|---|
| Authors: | Hoti, Suhejla ; Mcaleer, Michael |
| Published in: |
Journal of economic surveys. - Oxford [u.a.] : Wiley-Blackwell, ISSN 0950-0804, ZDB-ID 722946x. - Vol. 20.2006, 4, p. 691-714
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