How knowledge exploration distance influences the quality of innovation
Wei-Long Lee, Jiunn-Chiou Chiang, Yu-Hsien Wu and Chih-Hsing Liu
| Year of publication: |
2012
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|---|---|
| Authors: | Lee, Wei-long ; Chiang, Jiunn-chiou ; Wu, Yu-hsien ; Liu, Chih-hsing |
| Published in: |
Total quality management & business excellence : an official journal of the European Society for Organisational Excellence. - Abingdon, Oxfordshire : Routledge, ISSN 1478-3363, ZDB-ID 2101779-7. - Vol. 23.2012, 9, p. 1045-1059
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| Subject: | Wissenstransfer | Knowledge transfer | Innovation | Patent | Telekommunikationsausrüster | Telecommunications equipment industry | USA | United States |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10009673885