How to count patents and value intellectual property : the uses of patent renewal and application data
Jean O. Lanjouw, Ariel Pakes and Jonathan Putnam
| Year of publication: |
1998
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|---|---|
| Authors: | Lanjouw, Jean Olson |
| Other Persons: | Pakes, Ariel (contributor) ; Putnam, Jonathan D. (contributor) |
| Published in: |
The journal of industrial economics. - Oxford : Wiley-Blackwell, ISSN 0022-1821, ZDB-ID 218160-5. - Vol. 46.1998, 4, p. 405-432
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| Subject: | Patent | Immaterialgüterrechte | Intellectual property rights | Innovation | Messung | Measurement | Welt | World |
| Extent: | Graph. Darst |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10001252323