How to measure patent thickets--A novel approach
This paper provides a direct measure of the density of patent thickets based on patent citations. We discuss the algorithm that generates the measure and present descriptive results validating it. Moreover, we identify technology areas particularly affected by patent thickets.
Year of publication: |
2011
|
---|---|
Authors: | von Graevenitz, Georg ; Wagner, Stefan ; Harhoff, Dietmar |
Published in: |
Economics Letters. - Elsevier, ISSN 0165-1765. - Vol. 111.2011, 1, p. 6-9
|
Publisher: |
Elsevier |
Keywords: | Patenting Patent thickets Patent portfolio races Complexity |
Saved in:
Online Resource
Saved in favorites
Similar items by person
-
Incidence and Growth of Patent Thickets - The Impact of Technological Opportunities and Complexity
von Graevenitz, Georg, (2011)
-
Conflict resolution, public goods and patent thickets
Harhoff, Dietmar, (2013)
-
How to measure patent thickets – a novel approach
von Graevenitz, Georg, (2009)
- More ...