Incidental Trends and the Power of Panel Unit Root Tests
Year of publication: |
2003-09
|
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Authors: | Moon, Hyungsik Roger ; Perron, Benoit ; Phillips, Peter C.B. |
Institutions: | Cowles Foundation for Research in Economics, Yale University |
Subject: | Asymptotic power envelope | Common point optimal test | Heterogeneous alternatives | Incidental trends | Local to unity | Power function | Panel unit root test |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | CFP 1215. Published in Journal of Econometrics (December 2007), 141(2): 416-459 The price is None Number 1435 43 pages |
Classification: | C22 - Time-Series Models ; C23 - Models with Panel Data |
Source: |
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Incidental Trends and the Power of Panel Unit Root Tests
Moon, Hyungsik Roger, (2005)
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Incidental Trends and the Power of Panel Unit Root Tests
Phillips, Peter C.B., (2004)
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Asymptotically UMP Panel Unit Root Tests
Drost, Feike C., (2013)
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GMM Estimation of Autoregressive Roots Near Unity with Panel Data
Moon, Hyungsik Roger, (2003)
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GMM Estimation of Autoregressive Roots Near Unity with Panel Data
Moon, Hyungsik Roger, (2000)
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Incidental Trends and the Power of Panel Unit Root Tests
Phillips, Peter C.B., (2004)
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