Industries at the World Technology Frontier: Measuring R&D Efficiency in a Non-Parametric DEA Framework
Year of publication: |
2011-09
|
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Authors: | Schmidt-Ehmcke, Jens ; Zloczysti, Petra |
Institutions: | C.E.P.R. Discussion Papers |
Subject: | data envelopment analysis | manufacturing | patents | R&D efficiency | technology frontier |
Extent: | application/pdf |
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Series: | |
Type of publication: | Book / Working Paper |
Notes: | Number 8579 |
Classification: | C14 - Semiparametric and Nonparametric Methods ; L60 - Industry Studies: Manufacturing. General ; O31 - Innovation and Invention: Processes and Incentives ; O57 - Comparative Studies of Countries |
Source: |
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Research efficiency in manufacturing: an application of DEA at the industry level
Schmidt-Ehmcke, Jens, (2009)
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Research Efficiency in Manufacturing: An Application of DEA at the Industry Level
Schmidt-Ehmcke, Jens, (2009)
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Research efficiency in manufacturing : an application of DEA at the industry level
Schmidt-Ehmcke, Jens, (2009)
- More ...
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R&D Efficiency and Barriers to Entry: A Two Stage Semi-Parametric DEA Approach
Cullmann, Astrid, (2010)
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Braun, Frauke G, (2010)
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Technology portfolio and market value
Schmidt-Ehmcke, Jens, (2008)
- More ...