Investigation of Reliability Measurements with Ramped and Constant Voltage Stress on MOS Gate Oxides
| Year of publication: |
1996
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|---|---|
| Authors: | Martin, A. ; O'Sullivan, P. ; Mathewson, A. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 12.1996, 4, p. 281-286
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