Josephson current through a ferromagnetic semiconductor/semiconductor/ferromagnetic semiconductor structure
We theoretically calculate the Josephson current for two superconductor/ferromagnetic semiconductor (SC/FS) bilayers separated by a semiconductor (SM) layer. It is found that the critical Josephson current I<Subscript>C</Subscript> in the junction is strongly determined by not only the relative orientations of the effective exchange field <InlineEquation ID="Equ1"> <EquationSource Format="TEX">${\bf h}$</EquationSource> </InlineEquation> of the two bilayers and scattering potential strengths at the interfaces but also the kinds of holes (the heavy or light) in the two FS layers. Furthermore, a robust approach to measuring the spin polarization P for the heavy and light holes is presented. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007
Year of publication: |
2007
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Authors: | Tao, Y. C. |
Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 56.2007, 2, p. 83-91
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Publisher: |
Springer |
Subject: | 74.50.+r Tunneling phenomena | point contacts | weak links | Josephson effects | 74.45.+c Proximity effects | Andreev effect | SN and SNS junctions | 75.50.Pp Magnetic semiconductors |
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