Measure twice, cut once : entrepreneurial ecosystem metrics
Year of publication: |
2022
|
---|---|
Authors: | Leendertse, Jip ; Schrijvers, Mirella ; Stam, Erik |
Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 51.2022, 9, p. 1-27
|
Subject: | Entrepreneurial ecosystem | Regional dynamics | Entrepreneurship | Economic development | Economic policy | Entrepreneurship policy | Entrepreneurship approach | Wirtschaftspolitik | Unternehmensgründung | Business start-up | Regionalpolitik | Regional policy | Unternehmer | Entrepreneurs | Regionalentwicklung | Regional development |
-
Measure twice, cut once : entrepreneurial ecosystem metrics
Leendertse, Jip, (2020)
-
Envisioning a new research agenda for entrepreneurial ecosystems : top-down and bottom-up approaches
Spigel, Ben, (2019)
-
Struggling with entrepreneurial ecosystems
Fritsch, Michael, (2024)
- More ...
-
Measure twice, cut once : entrepreneurial ecosystem metrics
Leendertse, Jip, (2020)
-
The entrepreneurial ecosystem clock keeps on ticking : regional persistence of high-growth firms
Dijk, Jasper J. van, (2024)
-
Figuring it out : configurations of high-performing entrepreneurial ecosystems in Europe
Schrijvers, Mirella, (2021)
- More ...