Measuring patent value indicators with patent renewal information
Year of publication: |
2020
|
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Authors: | Og, Joo Young ; Pawelec, Krzysztof ; Kim, Byung-Keun ; Paprocki, Rafal ; Jeong, EuiSeob |
Published in: |
Journal of open innovation : technology, market, and complexity. - Basel : MDPI, ISSN 2199-8531, ZDB-ID 2832108-X. - Vol. 6.2020, 1/16, p. 1-16
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Subject: | ex ante indicators | ex post indicators | learning effects | patent renewal model | patent value | pharmaceutical technology field | Patent | Bewertung | Evaluation | Patentrecht | Patent law | Messung | Measurement | Innovation |
Type of publication: | Article |
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Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
Language: | English |
Other identifiers: | 10.3390/joitmc6010016 [DOI] hdl:10419/241392 [Handle] |
Source: | ECONIS - Online Catalogue of the ZBW |
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