Measuring patent value indicators with patent renewal information
Year of publication: |
2020
|
---|---|
Authors: | Og, Joo Young ; Pawelec, Krzysztof ; Kim, Byung-Keun ; Paprocki, Rafal ; Jeong, EuiSeob |
Published in: |
Journal of Open Innovation: Technology, Market, and Complexity. - Basel : MDPI, ISSN 2199-8531. - Vol. 6.2020, 1, p. 1-16
|
Publisher: |
Basel : MDPI |
Subject: | ex ante indicators | ex post indicators | learning effects | patent renewal model | patent value | pharmaceutical technology field |
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