Modeling failure-data by a mixture of two Weibull distributions: A graphical approach
| Year of publication: |
1995
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| Authors: | Jiang, R. ; Murthy, D. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 44.1995, 3, p. 477-487
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