Neighboring knowledge recombination : knowledge relationship intensity, neighboring knowledge concentration, and knowledge impact
Tianyu Hou, Julie Juan Li, and Jun Lin
| Year of publication: |
2024
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|---|---|
| Authors: | Hou, Tianyu ; Li, Julie Juan ; Lin, Jun |
| Published in: |
IEEE transactions on engineering management : EM ; a publication of the IEEE Engineering Management Society. - New York, NY : IEEE, ISSN 1558-0040, ZDB-ID 2021741-9. - Vol. 71.2024, p. 5160-5173
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| Subject: | Knowledge impact | knowledge relationship intensity | neighboring knowledge concentration | patent | technological uncertainty | Wissen | Knowledge | Wissensmanagement | Knowledge management | Wissenstransfer | Knowledge transfer | Patent | Industrieforschung | Industrial research | Technischer Fortschritt | Technological change |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1109/TEM.2022.3212793 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10015411528