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Optimal Design of Partially Accelerated Life Tests for the Lognormal Distribution Under Type I Censoring
Bai, D.S., (1993)
Failure-censored Accelerated Life Test Sampling Plans for Weibull Distribution Under Expected Test Time Constraint
Bai, D.S., (1995)
Lifetime and reliability estimation of repairable redundant system subject to periodic alternation
Seo, J.H., (2003)