Off-specular X-ray scattering studies of the morphology of thin films

We discuss the scattering of X-rays from thin films at a surface or interface decorated with a morphology of islands and how these effects manifest themselves in the specular reflectivity and the diffuse (off-specular) scattering. We show how this technique has been used to study block copolymer films decorated with islands on the surface and the development of electrochemically induced pitting on a Cu electrode in an electrolyte solution.

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Year of publication:	1996
Authors:	Sinha, S.K. ; Feng, Y.P. ; Melendres, C.A. ; Lee, D.D. ; Russell, T.P. ; Satija, S.K. ; Sirota, E.B. ; Sanyal, M.K.
Published in:	Physica A: Statistical Mechanics and its Applications. - Elsevier, ISSN 0378-4371. - Vol. 231.1996, 1, p. 99-110
Publisher:	Elsevier

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Type of publication:	Article
Source:	RePEc - Research Papers in Economics

Persistent link: https://www.econbiz.de/10010874940