On Cumulative Conforming Type of Control Charts for High Quality Processes Under Sampling Inspection
Year of publication: |
2005
|
---|---|
Authors: | Zhang, C. W. ; Xie, M. ; Goh, T. N. |
Published in: |
Stochastics and Quality Control. - Walter de Gruyter GmbH & Co. KG, ISSN 2367-2404, ZDB-ID 2905267-1. - Vol. 20.2005, 2, p. 205-222
|
Publisher: |
Walter de Gruyter GmbH & Co. KG |
Subject: | Control chart | High yield process | Sampling inspection | Cumulative count of conforming |
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