On the concentration phenomenon for [phi]-subgaussian random elements
We study the deviation probability P{[short parallel]X[short parallel]-E[short parallel]X[short parallel]>t} where X is a [phi]-subgaussian random element taking values in the Hilbert space l2 and [phi](x) is an N-function. It is shown that the order of this deviation is exp{-[phi]*(Ct)}, where C depends on the sum of [phi]-subgaussian standard of the coordinates of the random element X and [phi]*(x) is the Young-Fenchel transform of [phi](x). An application to the classically subgaussian random variables ([phi](x)=x2/2) is given.
Year of publication: |
2006
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Authors: | Antonini, Rita Giuliano ; Hu, Tien-Chung ; Volodin, Andrei |
Published in: |
Statistics & Probability Letters. - Elsevier, ISSN 0167-7152. - Vol. 76.2006, 5, p. 465-469
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Publisher: |
Elsevier |
Keywords: | Concentration of measure phenomenon [phi]-Subgaussian random variables N-function Young-Fenchel transform Exponential inequalities |
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