Optimal Design of VSI _X Control Charts for Monitoring Correlated Samples
Year of publication: |
2005
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---|---|
Authors: | Chen, Yan-Kwang ; Chiou, Kuo-Ching |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 21.2005, 8, p. 757-768
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Saved in:
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