Optimal selection of the most reliable design whose degradation path satisfies a Wiener process
| Year of publication: |
2003
|
|---|---|
| Authors: | Yu, Hong-Fwu |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 20.2003, 8-9, p. 1084-1095
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