Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling
| Year of publication: |
2011
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|---|---|
| Authors: | Shanoun, M. ; Bassetto, S. ; Bastoini, S. ; Vialletelle, P. |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 49.2011, 13, p. 3873-3891
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