Optimum design of an efficient variables sampling system for validating process yield with Six-Sigma quality requirement and creation of a cloud-computing too
Year of publication: |
2025
|
---|---|
Authors: | Wu, Chien-wei ; Shu, Ming-Hung ; Hsu, Bi-Min ; Wang, To-Cheng |
Published in: |
European journal of industrial engineering : EJIE. - Genevè : Inderscience Enterprises, ISSN 1751-5262, ZDB-ID 2435893-9. - Vol. 19.2025, 1, p. 86-107
|
Subject: | alterable acceptance standard | lot sentencing | process yield | Six Sigma | tightened-normal-tightened sampling system | Qualitätsmanagement | Quality management | Stichprobenerhebung | Sampling | Prozessmanagement | Business process management | Theorie | Theory | Statistische Qualitätskontrolle | Statistical quality control |
-
Economic design of double sampling Cpm control chart for monitoring process capability
Tomohiro, Ryosuke, (2020)
-
Intermittent sampling for statistical process control with the number of defectives
Cobb, Barry R., (2024)
-
An improved skip-lot sampling scheme with resampling mechanism using an advanced capability index
Wang, Zih-Huei, (2025)
- More ...
-
Wu, Chien-wei, (2024)
-
Comparisons of frequentist and Bayesian inferences for interval estimation on process yield
Wu, Chien-wei, (2022)
-
Wu, Chien-wei, (2012)
- More ...