Optimum inspection policies of reliability analysis for quantal-response product with Weibull lifetime components
| Year of publication: |
2008
|
|---|---|
| Authors: | Chen, Yun-Shiow ; Pan, Chung-Chu ; Yang, Wei-Ning |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 25.2008, 4, p. 436
|