Optimum inspection policies of reliability analysis for quantal‐response product with Weibull lifetime components
Year of publication: |
2008
|
---|---|
Authors: | Chen, Yun‐Shiow ; Pan, Chung‐Chu ; Yang, Wei‐Ning |
Published in: |
International Journal of Quality & Reliability Management. - Emerald Group Publishing Limited, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 25.2008, 4, p. 436-450
|
Publisher: |
Emerald Group Publishing Limited |
Subject: | Monte Carlo simulation | Inspection | Product specification | Product life cycle | Quality control |
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