Optimum test-times for intermittent faults
| Year of publication: |
1995
|
|---|---|
| Authors: | Chung, K. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 44.1995, 4, p. 645-647
|