Patent examination at the State Intellectual Property Office in China
Year of publication: |
2013
|
---|---|
Authors: | Liegsalz, Johannes ; Wagner, Stefan |
Published in: |
Research Policy. - Elsevier, ISSN 0048-7333. - Vol. 42.2013, 2, p. 552-563
|
Publisher: |
Elsevier |
Subject: | Patent examination | Duration | State Intellectual Property Office (SIPO) | China |
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