Patent value and survival of patents
Year of publication: |
2021
|
---|---|
Authors: | Hwang, Jung-Tae ; Kim, Byung-Keun ; Jeong, EuiSeob |
Published in: |
Journal of Open Innovation: Technology, Market, and Complexity. - Basel : MDPI, ISSN 2199-8531. - Vol. 7.2021, 2, p. 1-9
|
Publisher: |
Basel : MDPI |
Subject: | Cox hazard regression | ex-ante indicators | ex-post indicators | patent renewal | survival analysis |
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