Patents, R&D and lag effects: evidence from flexible methods for count panel data on manufacturing firms
| Year of publication: |
2008
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|---|---|
| Authors: | Gurmu, Shiferaw ; Pérez-Sebastián, Fidel |
| Published in: |
Empirical economics : a journal of the Institute for Advanced Studies, Vienna, Austria. - Berlin : Springer, ISSN 0377-7332, ZDB-ID 5193941. - Vol. 35.2008, 3, p. 507-526
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