Patterns of technology life cycles : stochastic analysis based on patent citations
Changyong Lee, Juram Kim, Meansun Noh, Han-Gyun Woo and Kwangwook Gang
| Year of publication: |
January 2017
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| Authors: | Lee, Changyong ; Kim, Juram ; Noh, Meansun ; Woo, Han-Gyun ; Gang, KwangWook |
| Published in: |
Technology analysis & strategic management. - Abingdon, Oxfordshire : Routledge, Taylor & Francis, ISSN 0953-7325, ZDB-ID 32138-2. - Vol. 29.2017, 1, p. 53-67
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| Subject: | Patterns of technology life cycles | hidden Markov model | cluster analysis | patent citations | Patent | Bibliometrie | Bibliometrics | Produktlebenszyklus | Product life cycle | Theorie | Theory | Markov-Kette | Markov chain | Lebenszyklus | Life cycle | Clusteranalyse | Cluster analysis | Technischer Fortschritt | Technological change | Wissenstransfer | Knowledge transfer |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1080/09537325.2016.1194974 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10011710066