Prediction - An Approach to Reliability Assessment Under Degradation and Shock Process
| Year of publication: |
2011
|
|---|---|
| Authors: | Wang, Z ; Huang, H-Z ; Li, Y ; Xiao, N-C |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 60.2011, 4, p. 852-864
|