Quality and exposure control in semiconductor manufacturing, Part II : Evaluation
Belgacem Bettayeb, Samuel Basetto, Philippe Vialletelle and Michel Tollenaere
| Year of publication: |
2012
|
|---|---|
| Authors: | Bettayeb, Belgacem ; Basetto, Samuel ; Vialletelle, Philippe ; Tollenaere, Michel |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 50.2012, 23 (1.12.), p. 6852-6869
|
| Subject: | control plan | resource capacity and resource capability | risk exposure | Halbleiterindustrie | Semiconductor industry | Ressourcenorientierter Ansatz | Resource-based view | Qualitätsmanagement | Quality management |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10010219444