Quantitative mapping of patented technology : the case of electrical conducting polymer nanocomposite
Year of publication: |
2010
|
---|---|
Authors: | Lee, Pei-Chun ; Su, Hsin-Ning ; Wu, Feng-Shang |
Published in: |
Technological forecasting & social change : an international journal. - Amsterdam : Elsevier, ISSN 0040-1625, ZDB-ID 280700-2. - Vol. 77.2010, 3, p. 466-478
|
Subject: | Technischer Fortschritt | Technological change | Patent | Bibliometrie | Bibliometrics | Netzplantechnik | Project network techniques | Verbundwerkstoff | Composite materials |
-
Bullen, George N., (2015)
-
Samsung's catch-up with Sony : an analysis using US patent data
Joo, Si Hyung, (2010)
-
Yahyazadehfar, Mahmood, (2018)
- More ...
-
A systematic approach for integrated trend analysis—The case of etching
Wu, Feng-Shang, (2011)
-
Lee, Pei-Chun, (2010)
-
A systematic approach for integrated trend analysis : the case of etching
Wu, Feng-shang, (2011)
- More ...