Random effects logistic regression model for default prediction of technology credit guarantee fund
| Year of publication: |
2007
|
|---|---|
| Authors: | Sohn, So Young ; Kim, Hong Sik |
| Published in: |
European Journal of Operational Research. - Elsevier, ISSN 0377-2217. - Vol. 183.2007, 1, p. 472-478
|
| Publisher: |
Elsevier |