Regression Calibration in Semiparametric Accelerated Failure Time Models
| Year of publication: |
2010
|
|---|---|
| Authors: | Yu, Menggang ; Nan, Bin |
| Published in: |
Biometrics. - The International Biometric Society. - Vol. 66.2010, 2, p. 405-414
|
| Publisher: |
The International Biometric Society |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10010946760