Reliability analysis of accelerated life-test data from a repairable system
| Year of publication: |
1995
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|---|---|
| Authors: | Guida, M. ; Giorgio, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 44.1995, 2, p. 337-346
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