Reliability assessment for one-shot product with Weibull lifetime components
| Year of publication: |
2010
|
|---|---|
| Authors: | Pan, Chung-Chu ; Chu, Liou |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 27.2010, 5 (1.1.), p. 596-611
|