Reliability Assessment of Metallized Film Capacitors using Reduced Degradation Test Sample
| Year of publication: |
2013
|
|---|---|
| Authors: | Sun, Quan ; Tang, Yanzhen ; Feng, Jing ; Jin, Tongdan |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 29.2013, 2, p. 259-265
|