Reliability comparisons for plastic-encapsulated microcircuits
| Year of publication: |
1995
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|---|---|
| Authors: | Baker, B. ; Martin, S. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 44.1995, 1, p. 6-7
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