Reliability Demonstration Through Degradation Bogey Testing
| Year of publication: |
2009
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|---|---|
| Authors: | Yang, S ; Wu, J ; Pecht, M G |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 58.2009, 4, p. 604-611
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