Reliability of Series-Parallel Systems With Random Failure Propagation Time
Year of publication: |
2013
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Authors: | Levitin, G ; Xing, L ; Ben-Haim, H ; Dai, Y |
Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 62.2013, 3, p. 637-647
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