Reliability prediction and failure mode effects and criticality analysis (FMECA) of electronic devices using fuzzy logic
Year of publication: |
2005
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Authors: | Zafiropoulos, E.P. ; Dialynas, E.N. |
Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 22.2005, 2, p. 183-200
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