Reliability Test Plans for Percentiles Based on the Harris Generalized Linear Exponential Distribution

Abstract In this paper, a generalization of the Harris family of distributions, namely, the Harris generalized linear exponential distribution is discussed. The use of the model is established by fitting it to a real data set. Also, we derive a reliability test plan for acceptance or rejection of a lot of products submitted for inspection with lifetimes following this distribution.

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Year of publication:	2018
Authors:	Jose, K. K. ; Paul, Albin
Published in:	Stochastics and Quality Control. - De Gruyter, ISSN 2367-2404, ZDB-ID 2905267-1. - Vol. 33.2018, 1, p. 61-70
Publisher:	De Gruyter
Subject:	Harris Generalization \| Harris Generalized Linear Exponential Distribution \| Reliability Test Plan

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Type of publication:	Article
Language:	Undetermined
Other identifiers:	10.1515/eqc-2017-0025 [DOI]
Source:	Other ZBW resources

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