Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process
| Year of publication: |
2012
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|---|---|
| Authors: | Si, X-S ; Wang, W ; Hu, C-H ; Zhou, D-H ; Pecht, M G |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 61.2012, 1, p. 50-68
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